• Fine Leak Detect (Helium)
• Gross Leak Detect (NID) Negative Ion Detection

•    Human Body Model (HBM)
•    Machine Model (MM)

   Specialized Optical/Electrical Tests

• Insertion Loss
• Optical Gain
• Bit Error Rates (to 12 Gb/s)
• Optical Extinction Ratio
• Hi-Speed E/O Rise & Fall Times
• E/O Power Out
• E/O Spectrum Analysis

   Other Tests

• Gate Leakage
• Wafer Probing
• High Current Surge Test
• Semiconductor Parametric Analysis
• Custom Characterization in V, I, R, C, L, T, t, and f Domains
• Resistance-to-Solvents