Accelerated bias aging, HTOB,
HTOL, OLT, etc. are some of the names given to tests used
in determining the quality or reliability of product. Accelerated
bias aging uses elevated temperature to accelerate existing
failure mechanisms, thereby simulating years of real-life
operation in just hours or days. Regression curves are used
to plot the data of failures versus time and temperature.
These curves can then be used to extrapolate device performance
to the use condition, i.e. temperature. FIT rates (Failures-In-Time,
1e9 device-hours of operation) can be calculated using the
results of these aging experiments.
Silicon Cert, Ltd. (SCL) not only conducts this test for
its customers, but is also capable of providing the customized
aging boards required for the test, including their design
and prove-in. SCL has the ability to process several dozen
units up to 200°C. Typically this test requires the use
of dual power supplies, although this may be expanded if necessary.
SCL also has ac input capability to age devices dynamically,
thus more closely resembling actual use conditions. Our dedicated
ovens have internal plug-in sockets, externally mounted application
configurable interface cards, real time displays for monitoring
each device, elapsed time timers, and chart recorders for
temperature, voltage, current monitoring of up to 13 channels.
Additionally, SCL offers an option of monitoring and storing
snapshot data at intervals ranging from minutes to weeks or
longer through the use of our data acquisition system.
As with all testing done at Silicon Cert, accelerated bias
aging is performed with the utmost care and under tightly
controlled conditions. Our experienced team of professionals,
along with rigorous testing guidelines, assures you that all
testing is done precisely.
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