 The
use of Scanning Electron Microscopy (SEM) technology is an invaluable
aid whether characterizing products or resolving failure analysis
problems. Electrostatic discharge damage, contamination identification,
and micro-crack location are only a few of the uses of SEM when
performing failure analysis. Other applications include the
evaluation of materials (elemental analysis, mechanical damage,
etc.) and quality control evaluations such as dimension verification,
plating/coating thickness, and weld cross-sections.
Silicon Cert offers SEM and EDS (Energy Dispersive X-ray
Spectroscopy) services to our clients. Our Amray 1610 SEM,
with LaB6 filament, can provide topographical and compositional
information at magnifications of 20x to 20,000x and 120 A°
of resolution. Digital and/or Polaroid images can be provided.
A variety of sample prep techniques (cross-sectioning, decapsulation,
selective etching, overplating, and deprocessing) allows our
engineering team to provide our clients with IN-DEPTH PROBLEM
SOLVING at an AFFORDABLE PRICE. Visit our website to access
our on-line, confidential SEM Information Request Form for
a no-obligation quotation.
Don't forget- Silicon Cert, as a leading reliability testing
company with many years of experience, can perform SEM/EDS
services as well as reliability and qualification testing,
including:
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