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The characterization of materials
is an important step in understanding your product’s
performance. The product’s processing/construction/operation
relationship often holds the key to successful problem-solving
or product development. Silicon Cert takes pride in helping
their clients develop solutions to challenges in manufacturing,
quality assurance and development
Silicon Cert's engineering staff is highly experienced in
analyzing and identifying failure modes in a variety of products.
In addition we offer SEM and EDS services to aid our customers
with their product characterization and failure analysis problems.
A variety of sample prep techniques (cross-sectioning, decapsulation,
selective etching, overplating and deprocessing) allows our
engineering team to provide our clients with IN-DEPTH PROBLEM
SOLVING at an affordable price.
Electronics Packaging
Failure Analysis
- Micro-crack location
- Electrostatic discharge damage
- Contamination identification
Material Characterization
- Surface roughness
- Mechanical damage
- Metallurgical / interface structures
- Elemental analysis
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Quality Control Evaluations
- Dimension verifications
- Weld cross-section
- Plating/coating thickness
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Our company focus on customer service makes no project too
large or too small. We are committed to providing reliable
data in a user-friendly format with rapid turnaround and competitive
prices.
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